Mathematical Correction for Stress in Removed Layers in X-Ray Diffraction Residual Stress Analysis

Format:

Conference/Event

Author/Creator:

Moore, M. G., author.

Conference Name:

SAE Residual Stress Committee

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 1958

Summary:

DETERMINATION of subsurface residual stresses by X-ray diffraction and layer removal requires correction in the stresses as measured. The significance of the correction is proportional to the magnitude of relieved stress in the layer and to the depths involved.Correction formulas are developed for the solid circular cylinder, the hollow cylinder or tube, and the flat plate. Symmetric and non-symmetric peripheral stresses are taken for the solid cylinder. Examples are shown and limitations and applications of the formulas are discussed

Notes:

Vendor supplied data

Publisher Number:

580035

Access Restriction:

Restricted for use by site license