Computerized Control of Thick-Film Resistor Parameters

Format:

Conference/Event

Author/Creator:

Kenney, Phillip E., author.

Conference Name:

National Aeronautical and Space Engineering and Manufacturing Meeting (1971-09-28 : Los Angeles, California, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 1971

Summary:

Control of thick-film resistor parameters requires a substantial amount of data to be measured and calculated. The computer is an invaluable tool for saving time and errors in testing resistor materials. How the computer is used for control of resistor materials and its availability to companies of all sizes is the theme of this paper

Notes:

Vendor supplied data

Publisher Number:

710799

Access Restriction:

Restricted for use by site license