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Quality and Maintainability Measurement of Micro-Electronic Consumer Products
- Format:
- Conference/Event
- Author/Creator:
- Brewster, Franklin C., author.
- Conference Name:
- 9th Reliability and Maintainability Conference (1970-07-20 : Detroit, Michigan, United States)
- Language:
- English
- Physical Description:
- 1 online resource
- Place of Publication:
- Warrendale, PA SAE International 1970
- Summary:
- A simple, customer interrogation technique is described for manufacturers to obtain an unbiased consumer reaction to product quality and reliability. The plan will highlight variations between consumer reaction and factory tests. An example of product deterioration in storage is cited to illustrate how the system can identify problems and check on their resolution
- Notes:
- Vendor supplied data
- Publisher Number:
- 700647
- Access Restriction:
- Restricted for use by site license
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