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A Cost-Effective Calibration and Debug Interface for Automotive Controllers According to the www.NEXUS-STANDARD.org (IEEE-ISTO 5001) Ashling Microsystems Limited

SAE Technical Papers (1906-current) Available online

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Format:
Book
Conference/Event
Author/Creator:
Martin, Gerhard, author.
Conference Name:
SAE 2000 World Congress (2000-03-06 : Detroit, Michigan, United States)
Language:
English
Physical Description:
1 online resource cm
Place of Publication:
Warrendale, PA SAE International 2000
Summary:
This article describes how future Single-Chip ECU's can be debugged and calibrated using the new emerging debug standard known as GEPDIS informally named NEXUS.The paper explains why conventional debug and calibration methods no longer work with future ECU architectures. Infineon Technologies and some other leading semiconductor vendors and tool companies have worked on the development of a global embedded processor debug interface standard' called GEPDIS (1). Throughout this paper will use the GEPDIS short cut. The GEPDIS standard defines and implements a global, open, micro-controller development interface standard for embedded controller applications. The GEPDIS interface can be used for run-time Control, Code Execution and Data Trace, Calibration and Co-processor communication (for use in Rapid Prototyping)
Notes:
Vendor supplied data
Publisher Number:
2000-01-0390
Access Restriction:
Restricted for use by site license

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