A New Light Source Test Concept: Current Decay Osram Sylvania, Incorporated

Format:

Conference/Event

Author/Creator:

Lynn, Christopher S., author.

Conference Name:

International Congress & Exposition (1999-03-01 : Detroit, Michigan, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 1999

Summary:

A new test method, Current Decay, has been developed which aids in the early detection and removal of premature light source failures. These failures, whether mechanical or developmental, can go undetected until later processes where the severity of a failure has increased.The Current Decay test method provides the lamp assembly manufacture a repeatable and more accurate method to perform the light-up verification of the lamp assemblies' bulbs. Traditional light-up techniques are deficient in detecting certain failure modes including their various failure degrees. Especially when the light sources, bulbs, are inside the lamp assemblies making it difficult for an operator to notice the defect

Notes:

Vendor supplied data

Publisher Number:

1999-01-0704

Access Restriction:

Restricted for use by site license