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Detection of Shield Inhomogeneities of Muiticonductor Cables under Consideration of the Conductive Environment

SAE Technical Papers (1906-current) Available online

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Format:
Conference/Event
Author/Creator:
Jung, Lorenz, author.
Conference Name:
International Conference on Lightning and Static Electricity (1999-06-22 : Toulouse, France)
Language:
English
Physical Description:
1 online resource
Place of Publication:
Warrendale, PA SAE International 1999
Summary:
The determination of the complex transfer impedances and transfer admittances of shielded muiticonductor cables is the prerequisite for calculating disturbing currents on the inner wires of the cable. With a measurement procedure based on the improved triaxial measurement setups using muiticonductor transmission line theory for evaluation, it is possible to determine individual transfer impedances and admittances for each inner conductor of a shielded muiticonductor cable over a broad frequency range [3]. This paper shows the determination of the location and the calculation of the area of shield inhomogeneities by the evaluation of measured transfer impedances and admittances
Notes:
Vendor supplied data
Publisher Number:
1999-01-2328
Access Restriction:
Restricted for use by site license

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