Debunking the Myth of Parametrics or How I Learned to Stop Worrying and to Love DFM Galorath, Incorporated

Format:

Conference/Event

Author/Creator:

Ghosh, Biman K., author.

Conference Name:

International Congress & Exposition (1999-03-01 : Detroit, Michigan, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 1999

Summary:

SEER-DFM is a concurrent engineering tool that uses a parametric approach to enable a design team to minimize product costs by designing the product right the first time. A DFM analysis helps in conducting manufacturing/design analyses prior to decision making, conduct "what-if" comparisons, complete a consistent and traceable cost analysis from fabrication through final assembly

Notes:

Vendor supplied data

Publisher Number:

1999-01-0058

Access Restriction:

Restricted for use by site license