Simple, Closed-Form Expressions Relating Long-Term (Z score) and Short-Term (Defects per Opportunity) Variability Ford Motor Company

Format:

Conference/Event

Author/Creator:

Reagan, Steven W., author.

Conference Name:

SAE World Congress & Exhibition (2007-04-16 : Detroit, Michigan, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 2007

Summary:

A simple and accurate analytical expression relating the expected process (long term) and sampling (short-term) product variability is developed using a variational mathematical principle. Of the several complex functional forms discovered, simplicity and ease of use are used to select an expression providing the most reliable estimation for and convenient expression of Z score (σ level) as a function of defects per opportunity (DPO) or per million opportunities (DPMO). In the absence of scientific calculators or computers, this expression allows engineers to accurately estimate long term process variability to within 0.01 of its true value without resulting to (laborious) tables or a computer. Also, a high precision approximation is provided for cases when DPO is less than 1% which estimates Z-score to within 0.003 of the actual value (at 6σ)

Notes:

Vendor supplied data

Publisher Number:

2007-01-0993

Access Restriction:

Restricted for use by site license