Development of Advanced Finite Element Models of World SID 5th and 50th The Next Generation Side Impact Dummies First Technology Safety Systems, Incorporated

Format:

Conference/Event

Author/Creator:

Liu, Yi, author.

Conference Name:

SAE World Congress & Exhibition (2007-04-16 : Detroit, Michigan, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 2007

Summary:

This paper describes the development of new advanced Finite Element (FE) models of the World SID series, namely World SID 50th and 5th, the new generation of side impact Anthropomorphic Test Devices (ATD). The model development follows the FTSS's rigorous quality assurance (QA) procedure and uses the manufacture's product data and test facilities extensively. The models are validated at material, component and assembly, full dummy certification and sled test application levels. A detailed modeling methodology is described.The models correlate well with both the component and whole dummy level test results

Notes:

Vendor supplied data

Publisher Number:

2007-01-0891

Access Restriction:

Restricted for use by site license