Metrological Aspects of Six Sigma Applications MQVP, Incorporated; Vladimir State University

Format:

Conference/Event

Author/Creator:

Stoletova, Maria V., author.

Conference Name:

SAE 2006 World Congress & Exhibition (2006-04-03 : Detroit, Michigan, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 2006

Summary:

To monitor the success of the company in Six Sigma projects, it is critical to properly measure and confirm the quality of materials, parts, and processes.Most of the currently used metrological guidelines determine measurement accuracy, stability, et cetera as absolute values without regard to other parameters of a metrological system, in particular, measurement costs.This article discusses the criteria based on Type I (rejection of a good part) and Type II (acceptance of a defective part) errors occurring during the quality control. The paper shows how the criteria can connect accuracy and measurement costs related to re-work or warranty

Notes:

Vendor supplied data

Publisher Number:

2006-01-0554

Access Restriction:

Restricted for use by site license