Creating Test Patterns for Model-based Development of Automotive Software dSPACE GmbH

Format:

Conference/Event

Author/Creator:

Wewetzer, Christian, author.

Conference Name:

SAE 2006 World Congress & Exhibition (2006-04-03 : Detroit, Michigan, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 2006

Summary:

The importance of electronics, especially software, has greatly increased over the last few years. Efforts to maintain a high level of software quality have made testing an important part of the development process. With the advent of model-based development, testing methods can be used not only on code level, but also on model level. Next to test execution itself, test development is seen as the most time- and cost-intensive part of the testing process. This paper outlines and classifies current approaches to model-based test development, with the aim of providing guidelines for test developers for choosing the method best suited to the type of system under test and the test objective

Notes:

Vendor supplied data

Publisher Number:

2006-01-1598

Access Restriction:

Restricted for use by site license