Next Generation Test Automation ETAS GmbH

Format:

Book

Conference/Event

Author/Creator:

Anhalt, Christopher, author.

Conference Name:

SAE 2005 World Congress & Exhibition (2005-04-11 : Detroit, Michigan, United States)

Language:

English

Physical Description:

1 online resource cm

Place of Publication:

Warrendale, PA SAE International 2005

Summary:

This paper presents ETAS GmbH research and product development activities related to test automation for embedded systems in the automotive industry. We propose a structured approach to flexible, systematic and efficient test automation.This research is based on several years of experience with test automation processes, products and solutions. Current research and development activities are closely linked to a pilot customer, implementing unified and automated test processes across several divisions.Central aspects of our research include a precise definition of various tasks and roles in an overall test process, the flexible connection of test case development tools, and test bench independence.Our research helps create test solutions which offer improved reusability of test cases and better manageability of test processes

Notes:

Vendor supplied data

Publisher Number:

2005-01-1040

Access Restriction:

Restricted for use by site license