Integrated Test Platforms: Taking Advantage of Advances in Computer Hardware and Software Uson L.P

Format:

Book

Conference/Event

Author/Creator:

Robison, Mark D., author.

Conference Name:

SAE 2005 World Congress & Exhibition (2005-04-11 : Detroit, Michigan, United States)

Language:

English

Physical Description:

1 online resource cm

Place of Publication:

Warrendale, PA SAE International 2005

Summary:

Ongoing hardware, software, and networking advances in low-cost, general-purpose computing platforms have opened the door for powerful, highly usable, integrated test platforms for demanding industrial applications. With a focus on the automotive industry, this paper reviews the pros and cons of integrated test platforms versus single-purpose and stand-alone testers. Potential improvements in in-process testing are discussed along with techniques for effectively using such testing to improve daily production quality, to maintain high production rates, to avoid unplanned downtime, and to facilitate process and product improvements and refinements through the use of monitoring, data collection, and analysis tools

Notes:

Vendor supplied data

Publisher Number:

2005-01-1044

Access Restriction:

Restricted for use by site license