Identification of Integrated Circuits Conducted Emission Limits for Automotive Applications Politecnico di Torino, Electronic Department (Italy)

Format:

Conference/Event

Author/Creator:

Musolino, F., author.

Conference Name:

SAE 2005 World Congress & Exhibition (2005-04-11 : Detroit, Michigan, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 2005

Summary:

This paper describes an experimental technique to relate IC conduced emission, as measured by the 1 method (IEC 61967-4), and conducted emission measured by the ground plane method, as described in the CISPR 25 standard. In particular, the maximum limit of IC power supply current spectrum is derived on the basis of emission limits specified in the CISPR 25 document. Such information is useful when defining EMC specifications at IC level

Notes:

Vendor supplied data

Publisher Number:

2005-01-0634

Access Restriction:

Restricted for use by site license