Standardized, Universal and Web-Based Tool to Configure Test Applications for Vehicle Subsystems Worldwide Softing AG

Format:

Conference/Event

Author/Creator:

Rösch, Bernd, author.

Conference Name:

SAE 2005 World Congress & Exhibition (2005-04-11 : Detroit, Michigan, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 2005

Summary:

More and more automotive suppliers are moving their production of subsystems directly to the vehicle manufacturers' assembly plants all over the world. This close proximity allows the subsystem supplier to react even more quickly to diverse daily requirements. That means an immediate reaction to a changing number of units and to the numerous model variants. Each subsystem for a model variant may require different ECU variants. The subsystem has to be tested before delivery to the assembly line. While test beds are installed locally at production plants all over the world, automotive suppliers would like a central department for test specification, system setup, process flow, production control, flash sequence and diagnostic communication in order to reduce expenses and save on person power.The perfect way of achieving this goal would be to develop a standardized, universal and web-based tool. Access to the entire system configuration with test sequences and ECU communication and data must be possible via inter- or intranet. As a PC-based control system it should support all field bus systems via open interfaces (TCP/IP, PROFIBUS DP or DeviceNet) and provide a universal link for onboard and offboard communication based on ASAM standards (ASAM MCD-2 (ODX) and -3) with ECUs in subsystems. It should include communication links for K-line, CAN, Single Wire CAN, FlexRay, SAE J1850, LIN and MOST® and support protocols such as CARB, EOBD, UDS, KWP 2000 on K-Line and CAN.Using standardized tools, interfaces and communication links in one automated test system and enabling worldwide access means lowest initial costs and less test development effort. Thus overall costs are much lower than for existing proprietary solutions

Notes:

Vendor supplied data

Publisher Number:

2005-01-1440

Access Restriction:

Restricted for use by site license