Understanding Particulate Contaminants via Automated Electron Beam Analysis ASPEX, LLC

Format:

Conference/Event

Author/Creator:

Schamber, Frederick H., author.

Conference Name:

SAE 2004 World Congress & Exhibition (2004-03-08 : Detroit, Michigan, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 2004

Summary:

Particulate contaminants are an important concern in today's precision automotive assemblies. Whether driven by quality, cost, or performance considerations understanding the source and impact of particles requires detailed knowledge of their distribution in size and composition. Particle-by-particle measurement of filtered material is today conducted automatically by computer-operated microscope systems. When an optimized electron beam analysis tool performs such automated microscopic examination it provides not only distributions of particulate material by size and shape, but also accurate classification by composition. Detailed images of individual particles are also readily obtained and can be a great aid to source evaluation

Notes:

Vendor supplied data

Publisher Number:

2004-01-1337

Access Restriction:

Restricted for use by site license