Virtual Key Life Tests of Instrument Panels for Product Development Visteon Corporation

Format:

Conference/Event

Author/Creator:

Su, Hong, author.

Conference Name:

SAE 2004 World Congress & Exhibition (2004-03-08 : Detroit, Michigan, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 2004

Summary:

Visteon has developed a CAE procedure to qualify instrument panel (IP) products under the vehicle key life test environments, by employing a set of CAE simulation and durability techniques. The virtual key life test method simulates the same structural configuration and the proving ground road loads as in the physical test. A representative dynamic road load profile model is constructed based on the vehicle proving ground field data. The dynamic stress simulation is realized by employing the finite element transient analysis. The durability evaluation is based on the dynamic stress results and the material fatigue properties of each component. The procedure has helped the IP engineering team to identify and correct potential durability problems at earlier design stage without a prototype. It has shown that the CAE virtual key life test procedure provides a way to speed up IP product development, to minimize prototypes and costs. With virtual test method we can gain the insight relationship into the design parameters, component weak spots and product life, provide the guidance to design improvement, and achieve our goal for only one successful physical key life test

Notes:

Vendor supplied data

Publisher Number:

2004-01-1482

Access Restriction:

Restricted for use by site license