Effects of Surfactant Contamination on the Next Generation Gas Trap for the ISS Internal Thermal Control System Honeywell, Incorporated

Format:

Conference/Event

Author/Creator:

Leimkuehler, Thomas O., author.

Conference Name:

International Conference On Environmental Systems (2004-07-19 : Colorado Springs, Colorado, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 2004

Summary:

The current dual-membrane gas trap is designed to remove gas bubbles from the Internal Thermal Control System (ITCS) coolant on board the International Space Station (ISS). To date it has successfully served its purpose of preventing gas bubbles from causing depriming, overspeed, and shutdown of the ITCS pumps. However, contamination in the ITCS coolant has adversely affected the gas venting rate and lifetime of the gas trap, warranting a development effort for a next-generation gas trap. Previous testing has shown that a hydrophobic-only design is capable of performing even better than the current dual-membrane design for both steady-state gas removal and gas slug removal in clean deionized water. This paper presents results of testing to evaluate the effects of surfactant contamination on the steady-state performance of the hydrophobic-only design

Notes:

Vendor supplied data

Publisher Number:

2004-01-2429

Access Restriction:

Restricted for use by site license