Heat Generation in the Metal-Oxide-Silicon Field-Effect Transistor (MOSFET) and Possible Thermal Management Solutions

Format:

Conference/Event

Author/Creator:

Jones, Keith W., author.

Conference Name:

International Conference On Environmental Systems (2004-07-19 : Colorado Springs, Colorado, United States)

Language:

English

Physical Description:

1 online resource

Place of Publication:

Warrendale, PA SAE International 2004

Summary:

In this paper, we discuss the metal-oxide-silicon field-effect transistor (MOSFET) also known as the insulated-gate field-effect transistor (IGFET); its applications; the heat it generates because of its material properties. The paper discusses MOSFET's dimensions, densities, and why the heat it generates is continually increasing. Finally, there is discussion about various present-day thermal management solutions used for resolving MOSFET thermal issues and a recommendation for future approaches

Notes:

Vendor supplied data

Publisher Number:

2004-01-2571

Access Restriction:

Restricted for use by site license