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Radiation Tolerant Nyquist Analog to Digital Converters / by Zheyi Li, Laurent Berti, Paul Leroux.
Springer Nature - Synthesis Collection of Technology (R0) eBook Collection 2026 Available online
View online- Format:
- Book
- Author/Creator:
- Li, Zheyi.
- Series:
- Synthesis Lectures on Engineering, Science, and Technology, 2690-0327
- Language:
- English
- Subjects (All):
- Electronic circuit design.
- Embedded computer systems.
- Telecommunication.
- Electronics Design and Verification.
- Embedded Systems.
- Microwaves, RF Engineering and Optical Communications.
- Local Subjects:
- Electronics Design and Verification.
- Embedded Systems.
- Microwaves, RF Engineering and Optical Communications.
- Physical Description:
- 1 online resource (220 pages)
- Edition:
- 1st ed. 2026.
- Place of Publication:
- Cham : Springer Nature Switzerland : Imprint: Springer, 2026.
- Summary:
- This book presents the detailed design considerations and techniques for radiation-tolerant (RT) Nyquist analog-to-digital converters (ADC). It begins with the fundamental radiation effects in space and its consequences in modern CMOS technology. Next, radiation effects on ADCs from the transistor level to the architectural level are examined and a detailed design tradeoffs and strategies for radiation-tolerant ADCs are described. The theory and hardening techniques are supported by measurement data from a high-performance RT-ADC prototype chip. Two important flows, which are a technology evaluation flow and an RT IC design flow, are also covered, in order to give a complete overview on how to achieve an effective RT circuits design. In addition, this book; Provides a detailed analysis on the ionizing radiation effects on analog-to-digital converters Reveals detailed explanations on radiation-tolerant ADC design tradeoffs Includes a practical design and evaluation flow for radiation-tolerate analog/mixed signal circuits development.
- Contents:
- Chapter 1: Introduction
- Chapter 2: Radiation Effects in CMOS Technology and Mitigating Techniques
- Chapter 3: Radiation Hardened IC Design and Evaluation Flow.
- Notes:
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 3-031-95599-4
- 9783031955990
- OCLC:
- 1543045019
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