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Kristall und Technik : [Fortsetzung: Crystal Research and Technology]. Band 7, Heft 12.

DGBA Physical Sciences <1990 Available online

View online
Format:
Book
Contributor:
Beleites, H., Contributor.
Bijvoet, J. M., Contributor.
Bublik, V. T., Contributor.
Bulakh, B. M., Contributor.
Burgers, W. G., Contributor.
Dashevsky, M. Ya., Contributor.
Escher, P., Contributor.
Fischer, R. M., Contributor.
Fröhlich, F., Contributor.
Fulrath, R. M., Contributor.
Gorelik, S. S., Contributor.
Hamann, C., Contributor.
Handeos, L. I., Contributor.
Hawkes, P. W., Contributor.
Hägg, E., Contributor.
Isaakjan, V. A., Contributor.
Khatsernov, M. A., Contributor.
Makeev, H. I., Contributor.
Malvinova, I. S., Contributor.
Melesko, L. O., Contributor.
Müller, B., Contributor.
Pekar, G. S., Contributor.
Rath, Robert, Contributor.
Starke, M., Contributor.
Thomas, G., Contributor.
Voronov, I. N., Contributor.
Wagner, H., Contributor.
Series:
Kristall und Technik ; Band 7, Heft 12
Language:
German
Subjects (All):
Crystallography--Periodicals.
Crystallography.
Physical Description:
1 online resource (100 p.)
Edition:
Reprint 2022
Place of Publication:
Berlin ; Boston : De Gruyter, [2022]
Language Note:
In German.
Summary:
Keine ausführliche Beschreibung für "KRISTALL UND TECHNIK BD. 7/12 KRTEA E-BOOK" verfügbar.
Contents:
Frontmatter
Hinweise für die Autoren
Inhalt
Originalbeiträge
Effect of Growth Conditions on Formation and Properties of CdS Single Crystals at Dynamic Sublimation
Zur Struktur von organischen Mischkristallschichten
Autoradiographic Investigation on the Incorporation of Ca Ions in KCl Crystals during Kyropoulos Growth
Untersuchung der linearen Kristallisationsgeschwindigkeit
X-Ray Topographic Investigation of Silicon Single Crystals Heavily Doped with Sb
X-Ray Topographic Investigation of Dendritic Silicon Crystals
Ein röntgendiffraktometrisches Verfahren zur Korngrößenbestimmung
Recommended Symbols for Industrial Crystallisation
Buchbesprechungen
Electron Microscopy and Structure of Materials
Electron Optics and Electron Microscopy
Theoretische Grundlagen der allgemeinen Kristalldiagnose im durchfallenden Licht
Early Papers on Diffraction of X-rays by Crystals
Notes:
Description based on online resource; title from PDF title page (publisher's Web site, viewed 04. Okt 2022)
Description based on publisher supplied metadata and other sources.
ISBN:
9783112653845
311265384X
OCLC:
1415896547

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