Crystal Research and Technology : Journal of Experimental and Industrial Crystallography / Zeitschrift für experimentelle und technische Kristallographie. Volume 23, Number 1, January / hrsg. von H. Neels.

Format:

Book

Contributor:

Auleytner, J, Contributor.

Bak-Misiuk, J, Contributor.

Berger, H, Contributor.

Bhar, G . C., Contributor.

Braun, U., Contributor.

Buhrig, E, Contributor.

Butter, E, Contributor.

Demus, D, Contributor.

Diele, S, Contributor.

Feltz, A., Contributor.

Fenster, J, Contributor.

Fichtner, K., Contributor.

Finger, G., Contributor.

Fischer, K ., Contributor.

Furmanik, Z., Contributor.

Geidel, B, Contributor.

Ghosh, D . K, Contributor.

Goliö, L, Contributor.

Gottschalch, V., Contributor.

Görls, H., Contributor.

Hein, K, Contributor.

Hejtminek, J, Contributor.

Heydenbeich, J, Contributor.

Hobler, H.-J., Contributor.

Jurek, K, Contributor.

Jurkschat, K, Contributor.

Kamarad, J, Contributor.

Kbesse, H., Contributor.

Klimakow, A., Contributor.

Koknatowski, J ., Contributor.

Kurth, E., Contributor.

Kühn, G., Contributor.

Leban, I ., Contributor.

Mihailov, M.G., Contributor.

Minchev, G. M, Contributor.

Morawiec, J ., Contributor.

Mühlberg, M., Contributor.

Neels, H., Editor.

Neumann, H., Contributor.

Nowak, E, Contributor.

Omar, M. S., Contributor.

Paufler, P, Contributor.

Pfaff, G., Contributor.

Pollert, E, Contributor.

Pramatarova, L . D, Contributor.

Rabenstein, P, Contributor.

Reif, A., Contributor.

Richter, R, Contributor.

Rosenthal, U, Contributor.

Samanta, L.K, Contributor.

Savova, E . B, Contributor.

Schenk, M., Contributor.

Schmitz, W, Contributor.

Schmitz, W., Contributor.

Schreiter, P, Contributor.

Schulz, B, Contributor.

Schulz, W, Contributor.

Schumann, B ., Contributor.

Sieleb, J, Contributor.

Sinn, E, Contributor.

Stettin, H., Contributor.

Tempel, A., Contributor.

Triska, A, Contributor.

Umpfenbach, U, Contributor.

Wagner, G., Contributor.

Walter, G, Contributor.

Weissflog, W, Contributor.

Werner, U., Contributor.

Wienecke, M., Contributor.

Zahn, A., Contributor.

Zemanova, D., Contributor.

Series:

Crystal Research and Technology ; Volume 23, Number 1

Language:

German

Physical Description:

1 online resource (174 p.)

Edition:

Reprint 2021

Place of Publication:

Berlin ; Boston : De Gruyter, [2022]

Language Note:

In German.

Summary:

Keine ausführliche Beschreibung für "January" verfügbar.

Contents:

Frontmatter

Review

Epitaxy of AIBIIICVI2 Semiconductors

Original Papers

Solid-State Reactivity and Mechanisms in Oxide Systems (IV)

Crystal and Molecular Structure of (2-3-n-2-Butyne-l,4-diol)-bis-(triphenylphosphan)- nickel(O) Ni{[(C6H5)3P]2 (C4H6O2)}

Crystal and Molecular Structure of N-(Diethylaminothiocarbonyl)-N'-phenyl-benzamidine

Slip Band Formation during Bending of GaP Wafers

OD Approach to the Polytypism in CdP2

Revealing of Lattice Defects on (111) Faces of Gallium Phosphide and Indium Phosphide by Chemical Etching

Lattice Constants and Site Preference in the System Ni2SiO4-Co2SiO4

Nonstoichiometry and Point Defects in PbTe

Simulation of the Carrier Diffusion Process for the Interpretation of EBIC Profiles

Microhardness Scaling and Bulk Modulus-Microhardness Relationship in A"BIVCV2 Chalcopyrite Compounds

Heat Capacity of Ag8Ge10P12 from 180 to 550 K

Crystallographic Investigations of Glaucochroite in an Fe-Mn Slag

X-ray Determination of Solid Solution Composition in the Melilite System Äkermanite (AK) — Gehlenite (Ge) - Soda Melilite (Sm)

Chemical Etching and Polishing of InP

Calculation of One-Dimensional Temperatures Profiles in a Crystal Growth Furnace with Special Respect to Germanium

Liquid Crystalline Swallow-Tailed Compounds (II)

Short Notes

The Correlation between the Crystallization Field of Y3Fe5O12 and the Oxygen Ion Concentration of High-temperature Solvents

Effect of the Pressing on the Properties of the Superconducting YBa2Cu3O7-x Phase

Preparation of GaAs Substrates for MBE

Optical Properties of Some Quaternary Copper Chalcopyrites

On the Possibility of Application of X-ray Diffraction Edge Contrast for the Quantitative Determination of High-energy Heavy Ion Range in Silicon

Growth of NaX Zeolites in the Presence of Triethanolamine (TEA)

Contents

Notes:

Description based on online resource; title from PDF title page (publisher's Web site, viewed 31. Jan 2022)

Description based on publisher supplied metadata and other sources.

ISBN:

3-11-248560-2

OCLC:

1534200712