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Failure Analysis : High Technology Devices / Daniel J. D. Sullivan and Eric J. Carleton.
- Format:
- Book
- Author/Creator:
- Sullivan, Daniel J. D, author.
- Carleton, Eric J, author.
- Series:
- De Gruyter STEM.
- De Gruyter STEM
- Language:
- English
- Subjects (All):
- High technology.
- Failure analysis (Engineering).
- Physical Description:
- 1 online resource (i, 121 pages) : illustrations.
- Other Title:
- Failure Analysis
- Place of Publication:
- Berlin, Germany : De Gruyter, 2022.
- Summary:
- The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.
- Notes:
- Description based on: online resource; title from PDF information screen (De Gruyter, viewed November 24, 2022).
- Includes bibliographical references and index.
- ISBN:
- 9781501516474
- 1501516477
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