Rietveld Refinement : Practical Powder Diffraction Pattern Analysis using TOPAS / Robert E. Dinnebier, Andreas Leineweber, John S.O. Evans.

Format:

Book

Author/Creator:

Dinnebier, Robert E., author.

Evans, John S.O., author.

Leineweber, Andreas, author.

Series:

De Gruyter STEM

Language:

English

Subjects (All):

Rietveld method.

Physical Description:

1 online resource (348 pages)

Place of Publication:

Berlin ; Boston : De Gruyter, [2018]

Language Note:

In English.

Summary:

Almost 50 years have passed since the famous papers of Hugo Rietveld from the late sixties where he describes a method for the refinement of crystal structures from neutron powder diffraction data. Soon after, the potential of the method for laboratory X-ray powder diffraction was discovered. Although the method is now widely accepted, there are still many pitfalls in the theoretical understanding and in practical daily use. This book closes the gap with a theoretical introduction for each chapter followed by a practical approach. The flexible macro type language of the Topas Rietveld software can be considered as the defacto standard.

Contents:

Frontmatter

Preface

Contents

1. The powder diffraction method

2. The Rietveld method

3. Structure independent fitting

4. Peak shapes: Instrument o microstructure

5. Quantitative phase analysis

6. Restraints, constraints and rigid bodies

7. Solving crystal structures using the Rietveld method

8. Symmetry mode refinements

9. Magnetic refinements

10. Stacking disorder

11. Total scattering methods

12. Multiple data sets

13. Appendix: Mathematical basics

Index

Notes:

Description based on online resource; title from PDF title page (publisher's Web site, viewed 26. Mrz 2019)

ISBN:

9783110461404

3110461404

9783110461381

3110461382

OCLC:

1083592837