Comparison of laser-induced damage of optical crystals from the u.s.a. and u.s.s.r. MJ. Soileau, T. Wei, AA. Said, NI. Chapliev, SV. Garnov, AS. Epifanov

Format:

• Book

Author/Creator:

• Chapliev, NI., author.
• Epifanov, AS., author.
• Garnov, SV., author.
• Said, AA., author.
• Soileau, MJ., author.
• t.wei, author.

Contributor:

• ASTM International
• American Society for Testing and Materials
• American Society for Testing and Materials.

Language:

English

Subjects (All):

• Laser beams--Congresses.
• Laser beams.
• Laser materials--Effect of radiation on--Congresses.
• Optical materials--Effect of radiation on--Congresses.
• Thin films--Effect of radiation on--Congresses.
• Alkali metal halides.
• Bulk damage.
• SHG materials for the infrared.
• Wavelength dependence of damage.

Physical Description:

1 online resource (6 pages) illustrations, figures, tables

Place of Publication:

West Conshohocken, Pa. ASTM International 1991

Summary:

In this paper we report the results of comparative measurements of laser-induced damage (LID) in optical material from the USA and the USSR. Bulk LID thresholds were measured in very pure alkali halide crystals at 1064 nm and 532 nm and surface LID thresholds in selected nonlinear optical crystals were measured at 10.6 microns. The results show that the LID thresholds of the USSR and the USA samples are approximately the same except for KCl where the USA samples have a factor of 2 higher LID threshold electric field then the Soviet sample

Notes:

• Includes bibliographical references
• Online resource; title from publisher's website, viewed December 19, 2016

Related Work:

American Society for Testing and Materials. Selected Technical Papers