Secondary ion mass spectrometry and its application to materials science Sarah Fearn

Format:

Book

Author/Creator:

Fearn, Sarah, author.

Contributor:

Institute of Physics (Great Britain), publisher.

Standardized Title:

Introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science

Language:

English

Subjects (All):

Secondary ion mass spectrometry.

Time-of-flight mass spectrometry.

Materials science.

Physical Description:

1 online resource

Edition:

Second edition

Place of Publication:

IOP Publishing, 2025.

Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) IOP Publishing [2025]

Biography/History:

Sarah Fearn obtained her PhD from the Department of Materials, Imperial College in 2000. After working in commercial SIMS analysis for two years, she returned to academia in 2002. Since then, she has worked on a variety of research projects that have all applied SIMS as the main characterisation tool for understanding a range of material science issues such as glass corrosion, to calcium deposits in eye tissue. Over the last 20 years she has published ~90 papers spanning a wide range of material science issues and the application of SIMS. Since 2012 she has been in charge of the surface analysis laboratory in the Department of Materials at Imperial College

Summary:

In this edition of Secondary Ion Mass Spectrometry and Its Application to Material Science the authors expand further on the principles and methods presented in the first edition. A more detailed overview of the principles of SIMS is given, and of how the development of dual-beam instruments has blurred the traditional fields of dynamic and static SIMS to enable greater analytical possibilities. In particular, the development and application of cluster ion beams, and how this has opened up a new area of materials analysis. Practical information on how to obtain high quality SIMS data, and what parameters should be used to define this are also considered

Contents:

1. Introduction

2. Secondary ion generation, analysis, and detection

2.1. Secondary ion generation

2.2. Filtering, focussing, and steering

2.3. Sputtering and ionisation

2.4. Mass analysis

2.5. Secondary ion detection

2.6. Ultrahigh vacuum

3. Experimental ion beam considerations

3.1. Ion beam selection

3.2. Ion beam interactions

3.3. Modes of SIMS analysis

4. Data handling

4.1. Quantification based on relative sensitivity factors and ion implant standards

4.2. Quantification without standards

4.3. Multivariate analytical techniques

4.4. Sample handling and preparation

5. Applications

5.1. Functional devices

5.2. Metals and alloys

5.3. Energy-related materials

5.4. Biosciences

6. Outlook

Notes:

"Version: 20250801"--Title page verso

Revised edition of: An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science

Includes bibliographical references

Online resource; title from PDF title page (viewed on September 5, 2025)

Other Format:

Print version Secondary ion mass spectrometry and its application to materials science

ISBN:

9780750333313

9780750333306

OCLC:

1546620978

Access Restriction:

Restricted for use by site license