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Impact of accelerated stress-tests on SIC MOSFET precursor parameters / Joseph P. Kozak [and three others].
- Format:
- Book
- Government document
- Author/Creator:
- Kozak, Joseph P., author.
- Series:
- Conference paper (National Renewable Energy Laboratory (U.S.)) ; NREL/CP-5000-71331.
- Conference paper ; NREL/CP-5000-71331
- Language:
- English
- Subjects (All):
- Metal oxide semiconductor field-effect transistors--Testing.
- Metal oxide semiconductor field-effect transistors.
- Silicon carbide.
- Genre:
- Online resources.
- Physical Description:
- 1 online resource (5 pages) : color illustrations
- Other Title:
- Impact of accelerated stress tests on silicon carbide metal oxide semiconductor field effect transistors precursor parameters
- Place of Publication:
- [Golden, Colo.] : National Renewable Energy Laboratory, 2018.
- Notes:
- "Preprint."
- "Presented at International Symposium on 3D Power Electronics Integration and Manufacturing (3D PEIM), College Park, Maryland, June 25 - 27, 2018."
- "August 2018."
- Includes bibliographical references (page 5).
- Online resource; title from PDF title page (NREL, viewed October 10, 2018).
- OCLC:
- 1056245130
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