Nail to nail fingerprint challenge : prize analysis / Gregory Fiumara, Elham Tabassi, Patricia Flanagan, John Grantham, Kenneth Ko, Karen Marshall, Matthew Schwarz, Bryan Woodgate, Christopher Boehnen.

Format:

Book

Government document

Author/Creator:

Fiumara, Gregory P., author.

Tabassi, Elham, author.

Flanagan, Patricia, author.

Grantham, John D., author.

Ko, Kenneth, author.

Marshall, Karen (Of the National Institute of Standards and Technology), author.

Schwarz, Matthew, author.

Woodgate, Bryan, author.

Boehnen, Christopher, author.

Contributor:

National Institute of Standards and Technology (U.S.), issuing body.

Series:

NISTIR

NISTIR ; 8210

Language:

English

Subjects (All):

Fingerprints--Identification--Technological innovations--United States.

Fingerprints.

Fingerprints--Identification--Automation--Data processing.

Biometric identification--United States--Methodology.

Biometric identification.

United States.

Genre:

Online resources.

technical reports.

Technical reports.

Physical Description:

1 online resource (51 pages) : illustrations (some color)

Place of Publication:

[Gaithersburg, MD] : U.S. Department of Commerce, National Institute of Standards and Technology, 2018.

Summary:

"In September 2017, the Intelligence Advanced Research Projects Activity held a fngerprint data collection as part of the Nail to Nail Fingerprint Challenge. Participating Challengers deployed devices designed to collect an image of the full nail to nail surface area of a fngerprint -- equivalent to a rolled fngerprint -- from an unacclimated user without assistance from a trained device operator. Images captured from these devices were searched against a set of traditionally-captured operator-assisted rolled fngerprints. Thousands of latent fngerprints were also searched against the images."--Page 3

Notes:

Online resource, PDF version; title from title page (NIST, viewed May 9, 2018).

"April 2018."

Includes bibliographical references.

OCLC:

1035203203