2 options
Electrical impact of SiC structural crystal defects on high electric field devices / Philip G. Neudeck.
- Format:
- Book
- Government document
- Author/Creator:
- Neudeck, Philip G., author.
- Series:
- NASA technical memorandum ; 1999-209647.
- NASA/TM ; 1999-209647
- Language:
- English
- Genre:
- Online resources.
- Physical Description:
- 1 online resource (6 pages) : illustrations
- Other Title:
- Electrical impact of silicon carbide structural crystal defects on high electric field devices
- Place of Publication:
- Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, December 1999.
- Notes:
- "December 1999."
- "Prepared for the 1999 International Conference on Silicon Carbide and Related Materials sponsored by North Carolina State University, Raleigh, North Carolina, October 10-15, 1999."
- "Performing organization: National Aeronautics and Space Administration, John H. Glenn Research Center at Lewis Field"--Report documentation page
- Includes bibliographical references (page 6).
- Online resource; title from PDF title page (NASA, viewed September 13, 2017).
- Other Format:
- Microfiche version: Neudeck, Philip G. Electrical impact of SiC structural crystal defects on high electric field devices
- OCLC:
- 1003531351
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