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Large-area material and junction damage in c-Si solar cells by potential-induced degradation : preprint / Chuanxiao Xiao, Chun-Sheng Jiang, Steve P. Harvey, Jun Liu, Helio Moutinho, Peter Hacke, Steve Johnston, and Mowafak Al-Jassim.

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Format:
Book
Government document
Author/Creator:
Xiao, Chuanxiao, author.
Jiang, C.-S. (Chun-Sheng), author.
Harvey, Steve P. (Steven Paul), author.
Liu, Jun (Engineer), author.
Moutinho, Helio R., author.
Hacke, Peter, author.
Johnston, Steven Wade, author.
Al-Jassim, Mowafak, author.
Contributor:
National Renewable Energy Laboratory (U.S.), issuing body.
Series:
Conference paper (National Renewable Energy Laboratory (U.S.)) ; 5K00-70819.
Conference Paper NREL/CP ; 5K00-70819
Language:
English
Subjects (All):
World Conference on Photovoltaic Energy Conversion.
Atomic force microscopy--United States.
Atomic force microscopy.
United States.
Genre:
technical reports.
Technical reports.
Physical Description:
1 online resource (4 pages) : color illustrations
Place of Publication:
Golden, CO : National Renewable Energy Laboratory, 2018.
Notes:
"October 2018."
"Presented at the 2018 World Conference on Photovoltaic Energy Conversion (WCPEC-7) Waikoloa, Hawaii, June 10-15, 2018."
Includes bibliographical references (page 4).
Online resource, PDF version; title from title page (NREL, viewed May 16, 2019).
OCLC:
1101431561

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