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SEE test report for analog devices ADP3330 high accuracy, ultralow IQ, 200 mA, SOT-23, anyCAP low dropout regulator / Raymond Ladbury.
Connect to full text Available online
View online- Format:
- Book
- Government document
- Author/Creator:
- Ladbury, Raymond, author.
- Series:
- NASA technical memorandum ; 20210014982.
- NASA/TM ; 20210014982
- Language:
- English
- Subjects (All):
- Electrical engineering.
- Electronics.
- electrical engineering.
- Medical Subjects:
- Electronics.
- Physical Description:
- 1 online resource (5 pages) : illustrations (some color).
- Place of Publication:
- Greenbelt, Maryland : National Aeronautics and Space Administration, Goddard Space Flight Center, June 2021.
- Notes:
- "June 2021."
- "Test Engineer: Alyson Topper, Test Date: 24-27 October 2014, Report Date: 04 November 2014."
- Description based on online resource, PDF version; title from title page (NASA, viewed on June 24, 2021).
- OCLC:
- 1257491604
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