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Total ionizing dose test report for the SFT2222A NPN bipolar junction transistor / Dakai Chen, James Forney.
Connect to full text Available online
View online- Format:
- Book
- Government document
- Author/Creator:
- Chen, Dakai, 1982- author.
- Forney, James, author.
- Series:
- NASA technical memorandum ; 20210010530.
- NASA/TM ; 20210010530
- Language:
- English
- Subjects (All):
- Bipolar transistors.
- Physical Description:
- 1 online resource (approximately 22 pages) : illustrations.
- Place of Publication:
- Greenbelt, Maryland : National Aeronautics and Space Administration, Goddard Space Flight Center, April 2021.
- Notes:
- "April 2021."
- Includes bibliographical references (page 5).
- Description based on online resource, PDF version; title from title page (NASA, viewed on July 16, 2021).
- OCLC:
- 1260302569
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