2 options
Effect of titanium (Ti)-seed and in vacuo process flow on sputtered lead zirconate titanate thin films / Daniel M Potrepka [and six others] ; DEVCOM, Army Research Laboratory.
- Format:
- Book
- Government document
- Author/Creator:
- Potrepka, Daniel M., author.
- Series:
- Memorandum report ARL-MR ; 1007.
- ARL-MR ; 1007
- Language:
- English
- Subjects (All):
- Ferroelectric thin films--Analysis.
- Ferroelectric thin films.
- Sputtering (Physics).
- X-rays--Diffraction.
- X-rays.
- Electron microscopy.
- x-ray diffraction.
- electron microscopy.
- Genre:
- technical reports.
- Technical reports
- Technical reports.
- Physical Description:
- 1 online resource (v, 30 pages) ; illustrations (some colors).
- Place of Publication:
- Aberdeen Proving Ground, MD : DEVCOM, Army Research Laboratory, Sep 2019.
- Notes:
- "Sep 2019."
- "Approved for public release; distribution is unlimited."
- "Performing organization: CCDC Army Research Laboratory"--Report documentation page.
- In scope of the U.S. Government Publishing Office Cataloging and Indexing Program (C&I) and Federal Depository Library Program (FDLP).
- Includes bibliographical references (pages 15-16).
- Description based on online resource, title from PDF title page (DTIC, viewed on Aug. 1, 2023).
- OCLC:
- 1392094578
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