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Dielectric and conductor-loss characterization and measurements on electronic packaging materials / James. Baker-Jarvis [and five others].
Connect to full text Available online
View online- Format:
- Book
- Government document
- Author/Creator:
- Baker-Jarvis, James, author.
- Series:
- NIST technical note ; 1520.
- NIST Technical Note ; 1520
- Language:
- English
- Subjects (All):
- Electronic measurements.
- Electronic packaging.
- Genre:
- Online resources.
- technical reports.
- Technical reports
- Technical reports.
- Physical Description:
- 1 online resource (iv, 152 pages) : illustrations
- Production:
- Boulder, Colo. : U.S. Department of Commerce, National Institute of Standards and Technology, 2001.
- Notes:
- "July 2001."
- "CODEN: NTNOEF."
- Includes bibliographical references (pages 132-150).
- Online resource, PDF version; title from title page (NIST, viewed October 24, 2017).
- Other Format:
- Microform version: Dielectric and conductor-loss characterization and measurements on electronic packaging materials
- OCLC:
- 929068022
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