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Proceedings of the First International Symposium On Analytical Methods In Philately / edited by Thomas Lera, John H. Barwis, and David L. Herendeen.
Connect to full text Available online
View online- Format:
- Book
- Conference/Event
- Government document
- Conference Name:
- International Symposium on Analytical Methods in Philately (1st : 2012 : Washington, DC) http://viaf.org/viaf/304634761, author.
- Series:
- Smithsonian contributions to history and technology ; no. 57.
- Smithsonian contributions to history and technology, 1948-6006 ; number 57
- Language:
- English
- Subjects (All):
- Stamp collecting--Congresses.
- Stamp collecting.
- Postage stamps--Expertising--Congresses.
- Postage stamps.
- Postage stamps--Forgeries--Congresses.
- Postage stamps--Expertising.
- Postage stamps--Forgeries.
- Genre:
- Congresses.
- Conference papers and proceedings.
- Physical Description:
- 1 online resource ([ix], 121 pages) : illustrations (chiefly color).
- Place of Publication:
- Washington, D.C. : Smithsonian Institution Scholarly Press, 2013.
- Notes:
- Title from title screen (viewed Aug. 21, 2015).
- Includes bibliographical references.
- Other Format:
- Print version: International Symposium on Analytical Methods in Philately (1st : 2012 : Washington, DC). Proceedings of the First International Symposium On Analytical Methods In Philately.
- OCLC:
- 919003155
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