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The effect of experimental variables on industrial X-ray micro-computed sensitivity / Donald J. Roth, Richard W. Rauser.
Connect to full text Available online
View online- Format:
- Book
- Government document
- Author/Creator:
- Roth, Don J., author.
- Rauser, Richard W., author.
- Series:
- NASA technical memorandum ; 2014-218332.
- NASA/TM ; 2014-218332
- Language:
- English
- Subjects (All):
- Radiography.
- radiographs.
- radiography.
- Physical Description:
- 1 online resource (37 pages) : color illustrations.
- Place of Publication:
- Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, December 2014.
- Notes:
- Title from title screen (viewed on May 15, 2015).
- "December 2014."
- Includes bibliographical references (page 37).
- OCLC:
- 909021363
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