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Absolute thickness measurements on coatings without prior knowledge of material properties using terahertz energy / Donald J. Roth [and four others].
- Format:
- Book
- Government document
- Author/Creator:
- Roth, Don J., author.
- Series:
- NASA technical memorandum ; 2013-216603.
- NASA/TM ; 2013-216603
- Language:
- English
- Subjects (All):
- Dielectrics.
- Physical Description:
- 1 online resource (22 pages) : illustrations (some color).
- Place of Publication:
- Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, December 2013.
- Notes:
- Title from title screen (viewed Jan. 8, 2015).
- "December 2013."
- Includes bibliographical references (page 22).
- OCLC:
- 899588586
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