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On the effect of ramp rate in damage accumulation of the CPV die-attach : preprint / Nick S. Bosco, Timothy J. Silverman, and Sarah R. Kurtz.

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Format:
Book
Conference/Event
Government document
Author/Creator:
Bosco, Nick, author.
Silverman, Timothy J., author.
Kurtz, S. R., author.
Contributor:
National Renewable Energy Laboratory (U.S.)
Conference Name:
IEEE Photovoltaic Specialists Conference (2012 : Austin, Tex.)
Series:
Conference paper (National Renewable Energy Laboratory (U.S.)) ; 5200-54092.
Conference paper NREL/CP ; 5200-54092
Language:
English
Subjects (All):
Photovoltaic cells.
Solder and soldering.
photovoltaic cells.
solder.
Genre:
Conference papers and proceedings.
Physical Description:
1 online resource (6 pages) : illustrations (some color).
Place of Publication:
[Golden, CO] : National Renewable Energy Laboratory, [2012]
Notes:
Title from title screen (viewed on Aug. 6, 2012).
"June 2012."
"Presented at the 2012 IEEE Photovoltaic Specialists Conference, Austin, Taxas, June 3-8, 2012."
Includes bibliographical references (page 6).
OCLC:
805570938

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