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Modeling minority-carrier lifetime techniques that use transient excess-carrier decay / Steven W. Johnston, Gregory M. Berman, and Richard K. Ahrenkiel.
- Format:
- Book
- Conference/Event
- Government document
- Author/Creator:
- Johnston, Steven Wade
- Conference Name:
- IEEE Photovoltaic Specialists Conference (33rd : 2008 : San Diego, Calif.)
- Series:
- NREL/PO ; 520-43308.
- NREL/PO ; 520-43308
- Language:
- English
- Subjects (All):
- Photovoltaic cells--Research.
- Photovoltaic cells.
- Solar cells--Research.
- Solar cells.
- Excess carriers (Solid state physics).
- Physical Description:
- 1 online resource ([1] pages) : color illustrations.
- Place of Publication:
- Golden, Colo. : National Renewable Energy Laboratory, 2008.
- Notes:
- Title from title screen (viewed on July 16, 2012).
- Presented at the 33rd IEEE Photovoltaic Specialist Conference, 11-16 May 2008, San Diego, California.
- OCLC:
- 799873249
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