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On the resolution and image intensity of the field-ion microscope / by Victor G. Weizer and Americo F. Forestieri.

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Format:
Book
Government document
Author/Creator:
Weizer, Victor G., author.
Forestieri, Americo F., author.
Contributor:
United States. National Aeronautics and Space Administration, issuing body.
Series:
NASA technical note ; D-5125.
NASA/TN ; D-5125
Language:
English
Subjects (All):
Field ion microscopes.
Imaging systems--Image quality.
Imaging systems.
Physical Description:
1 online resource (ii, 14 pages) : illustrations
Place of Publication:
Washington, D.C. : National Aeronautics and Space Administration, March 1969.
Notes:
"March 1969."
Includes bibliographical references (pages 13-14).
Online resource, PDF version; title from title page (NASA, viewed on May 14, 2021).
Other Format:
Print version: Weizer, Victor G. On the resolution and image intensity of the field-ion microscope.
OCLC:
785074313

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