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In the matter of certain probe card assemblies, components thereof and certain tested DRAM an NAND flash memory devices and products containing same : investigation no. 337-TA-621.
- Format:
- Book
- Government document
- Author/Creator:
- United States International Trade Commission
- Series:
- USITC publication ; 4149.
- Publication ; 4149
- Language:
- English
- Subjects (All):
- Semiconductor storage devices.
- Flash memories (Computers).
- Computer storage devices.
- Patent infringement.
- Computer Storage Devices.
- Medical Subjects:
- Computer Storage Devices.
- Physical Description:
- 1 online resource ([243] pages) : illustrations.
- Other Title:
- Probe card assemblies, components thereof and certain tested DRAM an NAND flash memory devices and products containing same
- Place of Publication:
- Washington, DC : U.S. International Trade Commission, [2010]
- Notes:
- Title from title screen (viewed on Nov. 17, 2011).
- "June 2010."
- Includes bibliographical references.
- Other Format:
- Print version: United States International Trade Commission. In the matter of certain probe card assemblies, components thereof and certain tested DRAM and NAND flash memory devices and products containing same
- OCLC:
- 761308832
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