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Programmable, automated transistor test system / Long V. Truong and Gale R. Sundburg.
Connect to full text Available online
View online- Format:
- Book
- Government document
- Author/Creator:
- Truong, Long V., author.
- Sundburg, Gale R., author.
- Series:
- NASA technical paper ; 2554.
- NASA/TP ; 2554
- Language:
- English
- Subjects (All):
- Transistors--Testing--Computer programs.
- Transistors.
- Bipolar transistors--Testing--Computer programs.
- Bipolar transistors.
- Metal oxide semiconductors--Testing--Computer programs.
- Metal oxide semiconductors.
- Genre:
- Online resources.
- technical reports.
- Technical reports
- Technical reports.
- Physical Description:
- 1 online resource (22 pages) : illustrations.
- Place of Publication:
- Washington, D.C. : National Aeronautics and Space Administration, Scientific and Technical Information Branch, February 1986.
- Notes:
- "February 1986."
- Includes bibliographical references (page 22).
- Description based on online resource, PDF version; title from title page (NASA, viewed July 13, 2018).
- Electronic reproduction. [Place of publication not identified]: HathiTrust Digital Library. 2025.
- Other Format:
- Print version: Truong, Long V. Programmable, automated transistor test system.
- Microfiche version: Truong, Long V. Programmable, automated transistor test system.
- OCLC:
- 761309631
- Access Restriction:
- Use copy Restrictions unspecified
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