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Practical combinatorial testing / D. Richard Kuhn, Raghu N. Kacker, Yu Lei.
Connect to full text Available online
View online- Format:
- Book
- Government document
- Author/Creator:
- Kuhn, D. Richard
- Series:
- NIST special publication ; 800-142.
- NIST special publication. Information security
- NIST special publication ; 800-142. Information security
- Language:
- English
- Subjects (All):
- Computer software--Testing.
- Computer software.
- Computer software--Security measures.
- Combinatorial analysis.
- Genre:
- technical reports.
- Technical reports
- Technical reports.
- Physical Description:
- 1 online resource (vi, 75 pages) : illustrations
- Place of Publication:
- [Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2010]
- Summary:
- Combinatorial testing can help detect problems like this early in the testing life cycle. The key insight underlying t-way combinatorial testing is that not every parameter contributes to every fault and most faults are caused by interactions between a relatively small number of parameters. This publication provides a self-contained tutorial on using combinatorial testing for real-world software, including how to use it effectively for system and software assurance. It introduces the key concepts and methods, explains use of software tools for generating combinatorial tests (freely available on the NIST web site csrc.nist.gov/acts), and discusses advanced topics such as the use of formal models of software to determine the expected results for each set of test inputs. With each topic, a section on costs and practical considerations explains tradeoffs and limitations that may impact resources or funding. The material is accessible to an undergraduate student of computer science or engineering, and includes an extensive set of references to papers that provide more depth on each topic.
- Notes:
- Title from title screen (viewed on Nov. 2, 2011).
- "October, 2010."
- Includes bibliographical references (pages 70-75).
- OCLC:
- 759408064
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