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Modeling ellipsometry for SrTiO3 MBE epitaxial films on Si(100) / Daniel M. Potrepka.
- Format:
- Book
- Government document
- Author/Creator:
- Potrepka, Daniel M.
- Series:
- ARL-TR (Aberdeen Proving Ground, Md.) ; 5435.
- ARL-TR ; 5435
- Language:
- English
- Subjects (All):
- Strontium compounds.
- Silicon.
- Epitaxy.
- silicon.
- Physical Description:
- 1 online resource (vi, 12 pages) : color illustrations.
- Place of Publication:
- Adelphi, MD : Army Research Laboratory, [2011]
- Notes:
- Title from title screen (viewed on Jan. 3, 2012).
- "January 2011."
- Includes bibliographical references (page 10).
- Other Format:
- Print version: Potrepka, Daniel M. Modeling ellipsometry for SrTiO3 MBE epitaxial films on Si(100)
- OCLC:
- 770094013
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