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System voltage potential-induced degradation mechanisms in PV modules and methods for test : preprint / Peter Hacke, Kent Terwilliger, Ryan Smith, Stephen Glick, Joel Pankow, Michael Kempe, and Sarah Kurtz, Ian Bennett and Mario Kloos.
- Format:
- Book
- Conference/Event
- Government document
- Author/Creator:
- Hacke, Peter, author.
- Terwilliger, Kent, author.
- Smith, Ryan (Ryan Miles), author.
- Glick, Stephen H., author.
- Pankow, Joel W., author.
- Kempe, Michael D., author.
- Kurtz, S. R., author.
- Bennett, Ian (Ian John), author.
- Kloos, Mario, author.
- Conference Name:
- IEEE Photovoltaic Specialists Conference (37th : 2011 : Seattle, Wash.)
- Series:
- Conference paper (National Renewable Energy Laboratory (U.S.)) ; NREL/CP-5200-50716.
- NREL/CP ; 5200-50716
- Language:
- English
- Subjects (All):
- Photovoltaic power generation--Equipment and supplies--Service life.
- Photovoltaic power generation.
- Photovoltaic power systems--Reliability--Testing.
- Photovoltaic power systems.
- Genre:
- proceedings (reports)
- Conference papers and proceedings
- Conference papers and proceedings.
- Physical Description:
- 1 online resource (7 pages) : illustrations (some color).
- Place of Publication:
- [Golden, CO] : National Renewable Energy Laboratory, [2011]
- Notes:
- Title from title screen (viewed on Aug. 10, 2011).
- "July 2011."
- "Presented at the 37th IEEE Photovoltaic Specialists Conference (PVSC 37), Seattle, Washington, June 19-24, 2011."
- Includes bibliographical references (pages 6-7).
- OCLC:
- 746307263
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