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Temperature-dependent photoluminescence imaging and characterization of a multi-crystalline silicon solar cell defect area : preprint / Steve Johnston [and others].
- Format:
- Book
- Conference/Event
- Government document
- Conference Name:
- IEEE Photovoltaic Specialists Conference (37th : 2011 : Seattle, Wash.)
- Series:
- Conference paper (National Renewable Energy Laboratory (U.S.)) ; NREL/CP-5200-50706.
- NREL/CP ; 5200-50706
- Language:
- English
- Subjects (All):
- Photoluminescence.
- Photovoltaic cells--Research.
- Photovoltaic cells.
- Solar cells--Testing.
- Solar cells.
- Defects.
- photoluminescence.
- Genre:
- technical reports.
- Technical reports
- Technical reports.
- Physical Description:
- 1 online resource (6 pages) : illustrations (chiefly color).
- Place of Publication:
- [Golden, CO] : National Renewable Energy Laboratory, [2011]
- Summary:
- Photoluminescence (PL) imaging is used to detect areas in multi-crystalline silicon that appear dark in band-to-band imaging due to high recombination. Steady-state PL intensity can be correlated to effective minority-carrier lifetime, and its temperature dependence can provide additional lifetime-limiting defect information. An area of high defect density has been laser cut from a multi-crystalline silicon solar cell. Both band-to-band and defect-band PL imaging have been collected as a function of temperature from ~85 to 350 K. Band-to-band luminescence is collected by an InGaAs camera using a 1200-nm short-pass filter, while defect band luminescence is collected using a 1350-nm long pass filter. The defect band luminescence is characterized by cathodo-luminescence. Small pieces from adjacent areas within the same wafer are measured by deep-level transient spectroscopy (DLTS). DLTS detects a minority-carrier electron trap level with an activation energy of 0.45 eV on the sample that contained defects as seen by imaging.
- Notes:
- Title from title screen (viewed August 1, 2011).
- "July 2011."
- "Presented at the 37th IEEE Photovoltaic Specialists Conference (PVSC 37), Seattle, Washington, June 19-24, 2011."
- Includes bibliographical references (pages 5-6).
- OCLC:
- 743927810
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