2 options
The use of 2nd and 3rd level correlation analysis for studying degradation in polycrystalline thin-film solar cells / D.S. Albin [and others].
Connect to full text Available online
View online- Format:
- Book
- Conference/Event
- Government document
- Conference Name:
- IEEE Photovoltaic Specialists Conference (2010 : Honolulu, Hawaii)
- Series:
- Conference paper (National Renewable Energy Laboratory (U.S.)) ; 5200-48393.
- NREL/CP ; 5200-48393
- Language:
- English
- Subjects (All):
- Photovoltaic cells--Research.
- Photovoltaic cells.
- Solar cells--Testing.
- Solar cells.
- Thin films.
- Genre:
- technical reports.
- Technical reports
- Technical reports.
- Physical Description:
- 1 online resource (7 pages) : color illustrations.
- Other Title:
- Use of second and third level correlation analysis for studying degradation in polycrystalline thin film solar cells
- Place of Publication:
- [Golden, CO] : National Renewable Energy Laboratory, [2011]
- Summary:
- The correlation of stress-induced changes in the performance of laboratory-made CdTe solar cells with various 2nd and 3rd level metrics is discussed. The overall behavior of aggregated data showing how cell efficiency changes as a function of open-circuit voltage (Voc), short-circuit current density (Jsc), and fill factor (FF) is explained using a two-diode, PSpice model in which degradation is simulated by systematically changing model parameters. FF shows the highest correlation with performance during stress, and is subsequently shown to be most affected by shunt resistance, recombination and in some cases voltage-dependent collection. Large decreases in Jsc as well as increasing rates of Voc degradation are related to voltage-dependent collection effects and catastrophic shunting respectively. Large decreases in Voc in the absence of catastrophic shunting are attributed to increased recombination. The relevance of capacitance-derived data correlated with both Voc and FF is discussed.
- Notes:
- Title from title screen (viewed March 21, 2011).
- "March 2011."
- "Presented at the 35th IEEE Photovoltaic Specialists Conference (PVSC '10), Honolulu, Hawaii, June 20-25, 2010."
- Includes bibliographical references (pages 6-7).
- OCLC:
- 707927543
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.