2 options
Correlations of capacitance-voltage hysteresis with thin-film CdTe solar cell performance during accelerated lifetime testing / David Albin and Joseph del Cueto.
Connect to full text Available online
View online- Format:
- Book
- Conference/Event
- Government document
- Author/Creator:
- Albin, David S.
- Conference Name:
- International Reliability Physics Symposium (2010 : Garden Grove, Calif.)
- Series:
- Conference paper (National Renewable Energy Laboratory (U.S.)) ; NREL/CP-5200-47761.
- NREL/CP ; 5200-47761
- Language:
- English
- Subjects (All):
- Photovoltaic cells--Research.
- Photovoltaic cells.
- Solar cells--Testing.
- Solar cells.
- Thin films.
- Hysteresis.
- Genre:
- technical reports.
- Technical reports
- Technical reports.
- Physical Description:
- 1 online resource (5 pages) : illustrations.
- Other Title:
- Correlations of capacitance voltage hysteresis with thin film cadmium telluride solar cell performance
- Place of Publication:
- [Golden, CO] : National Renewable Energy Laboratory, [2011]
- Summary:
- In this paper we present the correlation of CdTe solar cell performance with capacitance-voltage hysteresis, defined presently as the difference in capacitance measured at zero-volt bias when collecting such data with different premeasurement bias conditions. These correlations were obtained on CdTe cells stressed under conditions of 1-sun illumination, open-circuit bias, and an acceleration temperature of approximately 100 degrees C.
- Notes:
- Title from title screen (viewed March 21, 2011).
- "March 2011."
- "Presented at the 2010 IEEE International Reliability Physics Symposium (IRPS), Garden Grove, California, May 2-6, 2010."
- Includes bibliographical references (page 5).
- OCLC:
- 707936160
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.