2 options
Capacitance cell measurement of the out-of-plane expansion of thin films / Chad R. Snyder, Frederick I. Mopsik.
Connect to full text Available online
View online- Format:
- Book
- Government document
- Author/Creator:
- Snyder, Chad R.
- Series:
- NIST recommended practice guide
- NIST special publication ; no. 960-7.
- NIST special publication ; no. 960-7
- Language:
- English
- Subjects (All):
- Thin-film circuits.
- Thin films--Thermal properties.
- Thin films.
- Expansion (Heat)--Measurement.
- Expansion (Heat).
- Genre:
- technical reports.
- Technical reports
- Technical reports.
- Physical Description:
- 1 online resource (x, 32 pages) : illustrations
- Place of Publication:
- [Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2001]
- Notes:
- Title from title screen (viewed Apr. 19, 2011).
- "November 2001."
- Includes bibliographical references (pages 31-32).
- "CODEN: NSPUE2."
- Other Format:
- Paper version: Snyder, Chad R. Capacitance cell measurement of the out-of-plane expansion of thin films.
- OCLC:
- 713565269
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.