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Status of structural analysis of substrates and film growth inputs for GaN device development program / Kevin Kirchner.
- Format:
- Book
- Government document
- Author/Creator:
- Kirchner, Kevin.
- Series:
- ARL-TR (Aberdeen Proving Ground, Md.) ; 5427.
- ARL-TR ; 5427
- Language:
- English
- Subjects (All):
- X-rays--Diffraction.
- X-rays.
- Homoepitaxy.
- Gallium nitride.
- X-Ray Diffraction.
- x-ray diffraction.
- Medical Subjects:
- X-Ray Diffraction.
- Physical Description:
- 1 online resource (vi, 28 pages) : color illustrations.
- Place of Publication:
- Adelphi, MD : Army Research Laboratory, [2011]
- Notes:
- Title from title screen (viewed on Mar. 3, 2011).
- "January 2011."
- Includes bibliographical references (page 2).
- OCLC:
- 704984556
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